Nanobeam X-Ray Scattering. Probing Matter at the Nanoscale - Virginie Chamard

Nanobeam X-Ray Scattering. Probing Matter at the Nanoscale - Virginie Chamard

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Produktinformationen

Details
EAN / ISBN-139783527410774
Höhe24.4 cm
AutorVirginie Chamard
ProduktformGebundene Ausgabe
Seitenanzahl284
HerausgeberWiley-VCH
Erscheinungsdatum 2013
InhaltsverzeichnisINTRODUCTION X-RAY DIFFRACTION PRINCIPLES -Introduction -Beam Coherence -Specific Properties of Different Sources: Laboratory vs Synchrotron vs FEL FOCUSING OF X-RAYS -Beam Propagation and Modeling -Focusing Principles Available for the Hard X-Ray Regime -Clasic Microfocusing Devices -Practical Issues SCATTERING EXPERIMENTS USING NANOBEAMS -From the Ensemble Average Approach Towards the Single Nanostructure Study -Diffraction from Single Nanostructures -Scanning X-Ray Diffraction Microscopy -Other Types of Contrast -Local X-Ray Probe Experiments from Organic Samples -Local X-Ray Probe Experiments from Biological Samples NANOBEAM DIFFRACTION SETUPS -Beam Positioning on the Nanoscale -Stability Issues: Maintaining the Spot on the Sample During Scanning Angles, Vibrations -Active Systems to Maintain the Beam Position on the Sample Constant -Restriction of Different Setups -Detector Issues: Resolution in Real and Reciprocal Space, Dynamic Range, Time Resolution SPECTROSCOPIC TECHNIQUES USING FOCUSED BEAMS -Micro/Nano-EXAFS, XANES. Fluorescence -A Side Glance on Soft X-Ray Applications COHERENT DIFFRACTION -More on Coherence Properties of Focused X-Ray Beams -The Use of Phase Retrieval Instead of Modeling Approaches -Different Retrieval Algorithms -Shape Determination of Single Structures (Retrieving the Modulus of Electron Density) -Strain Determination (Retrieving the Phase of Electron Density) -Fresnel Coherent Diffractive Imaging -Holographic Approaches (Using a Reference Wave Instead of Numerical Phase Retrieval) -Ptychography (For Extended Objects with Nanoscale Structure) -Particular Advantages and Problems when Using Coherent Diffraction Imaging in the Bragg Case THE POTENTIAL AND THE LIMITS OF THE METHOD -Limits in Beam Size -Limits in Intensity/Brilliance -Resolution Limits in Real and Reciprocal Space -Combinations with Other Local Probe Techniques FUTURE DEVELOPMENTS -Detector Developments -Beamlines at Third Generation Synchrotron Sources -The Role of Free Electron Lasers
HauptbeschreibungA comprehensive overview of the possibilities and potential of X-ray scattering using nanofocused beams for probing matter at the nanoscale, including guidance on the design of nanobeam experiments. The monograph discusses various sources, including free electron lasers, synchrotron radiation and other portable and non-portable X-ray sources. For scientists using synchrotron radiation or students and scientists with a background in X-ray scattering methods in general.
Breite17 cm
SpracheEnglisch

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