Technische Daten
Erscheinungsdatum
05.10.2015
Herausgeber
Springer Berlin
Autor
Jürgen Beyerer, Fernando Puente León, Christian Frese
Einbandart
Gebundene Ausgabe
Buch Untertitel
Automated Visual Inspection: Theory, Practice and Applications
Autorenporträt
Prof. Dr.-Ing. habil. Jürgen Beyerer received his doctoral degree in 1994 by working in the field of image processing and especially in the subject of texture analysis. He habilitated in 1994 in the field of measurement technology and ran a small business for five years, which developed innovative automated visual inspection systems for industrial applications. Since 2004, Prof. Beyerer is the director of the Fraunhofer Institute of Optronics, System Technologies and Image Exploitation in Karlsruhe, which is mainly focused on the field of image processing. Simultaneously, he is holding the chair `Vision and Fusion Laboratory’ at the Karlsruhe Institute of Technology (KIT) which performs research in the fields of image acquisition and image processing.Prof. Dr.-Ing. Fernando Puente León: received the Dipl.-Ing. degree in electrical engineering and the Ph.D. degree with a thesis on machine vision from the University of Karlsruhe, Germany, in 1994 and 1999, respectively. From 2001 to 2002, he was with the company DS2, Spain. In 2003, he became a full professor at the Department of Electrical Engineering and Information Technology of the Technical University of Munich, Germany. Since 2008, he is a professor with the Department of Electrical Engineering and Information Technology of Karlsruhe Institute of Technology, where he also heads the Institute of Industrial Information Technology. His research interests include image processing, machine vision, information fusion, measurement technology, and pattern recognition.Dr.-Ing. Christian Frese has been engaged in the field of computer vision and image processing since 2005. He has been actively participating in several research projects concerned with multi-view stereo reconstruction, range image processing, image fusion, feature extraction and image-based classification. He co-authored more than 25 scientific publications related to cognitive automobiles, robotics, and image processing.
Schlagwörter
Automated Visual Inspection, Image Evaluation, Image Processing, Industrial Machine Vision, Optical Inspection, Optical Measuring, Optical Quality Inspection, Quality Control
Thema-Inhalt
TJF - Elektronik
UYS - Digitale Signalverarbeitung (DSP)
UYQV - Maschinelles Sehen, Bildverstehen
TJFM - Regelungstechnik
PDD - Wissenschaftliche Standards, Normung usw.
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