Technische Daten
Erscheinungsdatum
22.12.2016
Herausgeber
Springer International Publishing
Einbandart
Gebundene Ausgabe
Autorenporträt
Charu C. Aggarwal is a Distinguished Research Staff Member (DRSM) at the IBM T. J. Watson Research Center in Yorktown Heights, New York. He completed his undergraduate degree in Computer Science from the Indian Institute of Technology at Kanpur in 1993 and his Ph.D. in Operations Research from the Massachusetts Institute of Technology in 1996. He has published more than 300 papers in refereed conferences and journals, and has applied for or been granted more than 80 patents. He is author or editor of 15 books, including textbooks on data mining, recommender systems, and outlier analysis. Because of the commercial value of his patents, he has thrice been designated a Master Inventor at IBM. He has received several internal and external awards, including the EDBT Test-of-Time Award (2014) and the IEEE ICDM Research Contributions Award (2015). He has also served as program or general chair of many major conferences in data mining. He is a fellow of the SIAM, ACM, and the IEEE, for “contributions to knowledge discovery and data mining algorithms.”
Schlagwörter
Outlier Analysis, Anomaly detection, Outlier detection, Novelty detection, Outlier ensembles, Temporal outlier detection, Temporal anomaly detection, Network outlier detection, Spatial outliers, Streaming outlier detection, Text outliers, Artificial intelligence, Data mining, Machine learning, Matrix factorization
Thema-Inhalt
UNF - Data Mining
UYQE - Wissensbasierte Systeme, Expertensysteme
PBT - Wahrscheinlichkeitsrechnung und Statistik
UFM - Mathematische und statistische Software
UYQ - Künstliche Intelligenz
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