Advances in X-Ray Analysis

31.07.1993

Englisch

9780306445712

Springer US

Nein

685

1

Gebundene Ausgabe

Volume 36

Mathematical Techniques in XRay Spectrometry: Research in the Quantitative Analysis of Individual Particles by XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of Light Elements by XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS Techniques and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, Industrial, and Other Applications of XRS: Application of XRF in the Aluminum Industry (F.R. Feret). XRay Characterization of Thin Films: Grazing Incidence XRay Characterization of Materials (D.K. Bowen, M. Wormington). WholePattern Fitting, Phase Analysis by Diffraction Methods: Phase Identification Using WholePattern Matching (D.K. Smith et al.). Polymer Applications of XRD. HighTemperature and NonAmbient Applications of XRD. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis. XRD Techniques and Instrumentation. 71 additional articles. Index.