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Bücher Wissen & Bildung Englische Bücher Naturwissenschaft, Medizin, Informatik, Technik Technik Elektronik, Elektro- und Nachrichtentechnik Knowledge-Driven Board-Level Functional Fault Diagnosis
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Knowledge-Driven Board-Level Functional Fault Diagnosis
Fangming Ye (Taschenbuch, Englisch)
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Beschreibung
This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing… reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design. • Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development. 93,08 €
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Technische Daten
Erscheinungsdatum
14.06.2018
Sprache
Englisch
EAN
9783319820545
Herausgeber
Springer International Publishing
Sonderedition
Nein
Autor
Fangming Ye
Seitenanzahl
147
Auflage
Softcover reprint of the original 1st edition 2017
Einbandart
Taschenbuch
Schlagwörter
Functional Fault Diagnosis, Intelligent Fault Diagnosis, Data-Driven Design of Fault Diagnosis, Resilient system design, Design, test, and repair of 3D-Integrated Circuits
Thema-Inhalt
TJFC - Schaltkreise und Komponenten (Bauteile)
UNF - Data Mining
UYQE - Wissensbasierte Systeme, Expertensysteme
TJF - Elektronik
Höhe
235 mm
Breite
15.5 cm
Hersteller: Birkhäuser, Europaplatz 3, Heidelberg, Deutschland, 69115, ProductSafety@springernature.com, Springer Nature Customer Service Center GmbH
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