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Bücher Englische Bücher Wissen & Bildung Naturwissenschaft, Medizin, Informatik, Technik Biologie Biochemie & Biophysik Elastic and Inelastic Scattering in Electron Diffraction and Imaging
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Elastic and Inelastic Scattering in Electron Diffraction and Imaging
Zhong-lin Wang (Gebundene Ausgabe, Englisch)
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Beschreibung
Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the… physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J. Dieses Produkt haben wir gerade leider nicht auf Lager.
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Technische Daten
Erscheinungsdatum
31.03.1995
Sprache
Englisch
EAN
9780306449291
Herausgeber
Springer US
Sonderedition
Nein
Autor
Zhong-lin Wang
Seitenanzahl
448
Auflage
1
Einbandart
Gebundene Ausgabe
Schlagwörter
crystal, diffraction, elastic scattering, electron diffraction, electron microscopy, electrons, microscopy, scanning transmission electron microscope, scattering, transmission electron microscopy, Biological Microscopy
Thema-Inhalt
PHVN - Biophysik
PSA - Biowissenschaften, allgemein
PHM - Atom- und Molekularphysik
PN - Chemie
PHFC - Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik)
PNFS - Spektroskopie, Spektrochemie, Massenspektrometrie
Höhe
229 mm
Breite
15.2 cm
Hersteller: Springer Nature Customer Service Center GmbH, ProductSafety@springernature.com
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