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Bücher Englische Bücher Wissen & Bildung Naturwissenschaft, Medizin, Informatik, Technik Medizin Klinische Fächer Advanced Scanning Electron Microscopy and X-Ray Microanalysis
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury (Gebundene Ausgabe, Englisch)
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Beschreibung
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in… 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course. Dieses Produkt haben wir gerade leider nicht auf Lager.
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Technische Daten
Erscheinungsdatum
31.03.1986
Sprache
Englisch
EAN
9780306421402
Herausgeber
Springer US
Sonderedition
Nein
Autor
Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
Seitenanzahl
454
Auflage
1
Einbandart
Gebundene Ausgabe
Schlagwörter
X-Ray, electron microscopy, microscopy, modeling, semiconductors
Thema-Inhalt
MKF - Pathologie
TGMT - Werkstoffprüfung
Höhe
234 mm
Breite
15.6 cm
Hersteller: Springer Nature Customer Service Center GmbH, ProductSafety@springernature.com
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