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Bücher Englische Bücher Wissen & Bildung Naturwissenschaft, Medizin, Informatik, Technik Technik Elektronik, Elektro- und Nachrichtentechnik Metric Driven Design Verification
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Metric Driven Design Verification
Hamilton B. Carter, Shankar G. Hemmady (Broschiert, Englisch)
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Beschreibung
Exponentially increasing design complexity has necessitated the adoption of metric driven planning and project management. Metric Driven Design Verification provides the semiconductor industry’s first metric driven based approach to functional verification. A metric based flow is described that focuses on the four steps of: 1. Planning: Defining what needs to be done and the automatically… trackable metrics that will be used to measure progress. 2. Execution: Implementing verification environments and then extensively exercising the device under verification utilizing comprehensive, massively parallel regression strategies. 3. Measurement: Automatically capturing the metrics defined in planning to provide objective data with which to manage the verification project. Custom tailoring those metrics through an automated reporting framework to provide all stakeholders a real-time meaningful view of project status. 4. Response: Utilizing the returned metrics to effectively adapt to changing project conditions. Making use of automated response mechanisms to automate engineering processed and management response to streamline project management processes. The primary audience for this book is professional engineers, managers, and executives. It is written in an easily understandable style and consists of four parts. The first three parts are tailored for executives, engineering managers, and engineers respectively. The fourth part presents case studies and commentaries from industry luminaries and experts on metric driven verification. Metric Driven Design Verification brings together the best practices and real-life experiences of several leading electronic companies worldwide in planning and managing verification projects, while automating critical processes. It addresses all aspects of verification and summarizes the different options available to engineers, managers and executives. 129,98 €
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Technische Daten
Erscheinungsdatum
29.10.2010
Sprache
Englisch
EAN
9781441942555
Herausgeber
Springer US
Sonderedition
Nein
Autor
Hamilton B. Carter, Shankar G. Hemmady
Seitenanzahl
361
Auflage
1
Einbandart
Broschiert
Buch Untertitel
An Engineer's and Executive's Guide to First Pass Success
Schlagwörter
ASIC, RTL, SoC, Software, SystemC, analog, chaos, complexity, integrated circuit, material, mechanism, modeling, network, semiconductor, simulation
Thema-Inhalt
TJFC - Schaltkreise und Komponenten (Bauteile)
THR - Elektrotechnik
TJF - Elektronik
Höhe
235 mm
Breite
15.5 cm
Hersteller: Springer, Europaplatz 3, Heidelberg, Deutschland, 69115, ProductSafety@springernature.com, Springer Nature Customer Service Center GmbH
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