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Bücher Englische Bücher Wissen & Bildung Naturwissenschaft, Medizin, Informatik, Technik Physik & Astronomie Atomphysik & Kernphysik X-Ray and Neutron Reflectivity: Principles and Applications
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X-Ray and Neutron Reflectivity: Principles and Applications
Jean Daillant (Gebundene Ausgabe, Englisch)
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Beschreibung
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron… and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years. Dieses Produkt haben wir gerade leider nicht auf Lager.
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Technische Daten
Erscheinungsdatum
17.09.1999
Sprache
Englisch
EAN
9783540661955
Herausgeber
Springer Berlin
Serien- oder Bandtitel
Lecture Notes in Physics Monographs
Sonderedition
Nein
Autor
Jean Daillant
Seitenanzahl
331
Einbandart
Gebundene Ausgabe
Bandzählung
58
Schlagwörter
surface, crystal, condensed matter, scattering, polymer
Thema-Inhalt
PNFS - Spektroskopie, Spektrochemie, Massenspektrometrie
PNFS - Spektroskopie, Spektrochemie, Massenspektrometrie
PDN - Wissenschaftliche Ausstattung, Experimente und Techniken
TGM - Materialwissenschaft
PNRX - Oberflächenchemie und Adsorption
PHP - Teilchen- und Hochenergiephysik
Höhe
235 mm
Breite
15.5 cm
-.-
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