A Practical Guide to Optical Metrology for Thin Films

15.10.2012

Englisch

9783527411672

Wiley-VCH

Nein

Michael Quinten

218

Broschiert

Dr. Michael Quinten works as Head of Research and Development Sensors at FRT GmbH in Bergisch Gladbach, Germany. Having obtained his diploma degree and Ph. D. in physics (1989) at the University of Saarland, Saarbruecken, Germany, he joined the Technical University RWTH Aachen in 1990 to work as a physics fessor. He then spent four years at several universities in Graz (Austria), Chemnitz, Aachen, Saarbruecken and Bochum (Germany). During his academic career, he authored 50 scientific publications on optical properties of nanoparticles, nanoparticle materials, and aerosols. In 2001, he joined the ETA-Optik GmbH, Germany, where he first worked in research and development of integrated optics components, and later became a product manager in the Colour and Coatings Division. During this period, he became expert in optical layer thickness determination. In 2007, he moved to FRT GmbH where he is responsible for the optical sensor technology division. He is the author of Optical Properties of Nanoparticle Systems: Mie and Beyond, Hardcover, 502 pages, Publisher: Wiley-VCH; 1 edition (March 15, 2011), ISBN10: 9783527410439, ISBN-13: 978-3527410439.

Analytical Chemistry, Analytische Chemie, Chemie, Chemistry, Dünne Schicht, Materials Science, Materialwissenschaften, Messen, Metrologie, Optical and Non-Linear Optical Materials, Optics & Photonics, Optik, Optik u. Photonik, Optische Messtechnik, Optische u. Nichtlineare Optische Materialien, Physics, Physik

PHJ - Optische Physik

240 mm

17 cm