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Optischer Zustand
Beschreibung
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources,… optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation. Dieses Produkt haben wir gerade leider nicht auf Lager.
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Bis zu 50 % günstiger als neu
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Technische Daten
Erscheinungsdatum
01.08.1988
Sprache
Englisch
EAN
9783540193920
Herausgeber
Springer Berlin
Serien- oder Bandtitel
Springer Series in Optical Sciences
Sonderedition
Nein
Seitenanzahl
455
Einbandart
Gebundene Ausgabe
Buch Untertitel
Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987
Bandzählung
56
Schlagwörter
image processing, scattering, laser, synchrotron radiation, development, coherence, optics, growth, preparation, quality, microscopy, Absorption, X-ray, diffraction, holography
Thema-Inhalt
PHJ - Optische Physik
TTB - Angewandte Optik
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