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Bücher Englische Bücher Wissen & Bildung Naturwissenschaft, Medizin, Informatik, Technik Physik & Astronomie Atomphysik & Kernphysik Identification of Special-Purpose Structures by Their Fragments Based on Scanning Electron Microscopy
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Identification of Special-Purpose Structures by Their Fragments Based on Scanning Electron Microscopy
Viacheslav L. Bogdanov, Alexander Ya. Grigorenko, Ihor B. Chepkov, Ihor V. Odnoralov, Andrii V. Kuchynskyi, Valerii V. Kremenytskyi, Svitlana O. Sperkach (Gebundene Ausgabe, Englisch)
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Beschreibung
This book contains previously classified information on the physical and chemical characteristics of metallic and composite materials used in the production of elements of special-purpose structures, and reveals the set of techniques and tools through which this information was obtained. It sets the foundations for the methodology of systematic automated identification of the special-purpose… structures by their fragments. The main topics are theoretical foundations and practical results of scanning electron microscopy in determining chemical composition, structure, surface topography and frequency characteristics (reflection and absorption coefficients of electromagnetic waves) of fragments of the structures made of both metal alloys and composite materials. Applied aspects such as the parameters of electromagnetic radiation recommended for effective identification of special-purpose structures made of composite radiation absorbent materials and coatings; development of a scientifically based system for automated identification of the structures by their fragments. The book is aimed at solving the problem to prevent uncontrolled or "gray" transfer of special-purpose products, technologies and materials of military or dual use by forming a scientifically based automatic identification system (by class and country of origin) of special-purpose products by their fragments, using scanning electron microscopy to determine their chemical composition, structure, surface topography, and frequency characteristics. The book is useful to a wide range of specialists in the field of materials science, as well as specialists in the defense sector of industry. Dieses Produkt haben wir gerade leider nicht auf Lager.
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Technische Daten
Erscheinungsdatum
02.06.2025
Sprache
Englisch
EAN
9783031888267
Herausgeber
Springer International Publishing
Serien- oder Bandtitel
Advanced Structured Materials
Sonderedition
Nein
Autor
Viacheslav L. Bogdanov, Alexander Ya. Grigorenko, Ihor B. Chepkov, Ihor V. Odnoralov, Andrii V. Kuchynskyi, Valerii V. Kremenytskyi, Svitlana O. Sperkach
Seitenanzahl
406
Einbandart
Gebundene Ausgabe
Schlagwörter
Atomic spectral analysis, STM Scanning electron microscopy, AFM Atomic Force Microscopy, metal fragments, X-ray microanalysis, special-purpose structural elements
Thema-Inhalt
PNFS - Spektroskopie, Spektrochemie, Massenspektrometrie
TGMT - Werkstoffprüfung
TGM - Materialwissenschaft
TGMP - Technische Anwendung von Polymeren und Verbundwerkstoffen
Höhe
235 mm
Breite
15.5 cm
Hersteller: Springer, Europaplatz 3, Heidelberg, Deutschland, 69115, ProductSafety@springernature.com, Springer Nature Customer Service Center GmbH
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