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Probability and Statistics for Machine Learning
Charu C. Aggarwal (Broschiert, Englisch)
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Beschreibung
This book covers probability and statistics from the machine learning perspective. The chapters of this book belong to three categories:
1.
The basics of probability and statistics:
These chapters focus on the basics of probability and statistics, and cover the key principles of these topics. Chapter 1 provides an overview of the area of probability and statistics as well as its relationship to 69,54 €
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Handgeprüfte Gebrauchtware
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Technische Daten
Erscheinungsdatum
16.05.2025
Sprache
Englisch
EAN
9783031532849
Herausgeber
Springer International Publishing
Sonderedition
Nein
Autor
Charu C. Aggarwal
Seitenanzahl
522
Einbandart
Broschiert
Buch Untertitel
A Textbook
Autorenporträt
Charu C. Aggarwal is a Distinguished Research Staff Member (DRSM) at the IBM T. J. Watson Research Center in Yorktown Heights, New York. He completed his undergraduate degree in Computer Science from the Indian Institute of Technology at Kanpur in 1993 and his Ph.D. in Operations Research from the Massachusetts Institute of Technology in 1996. He has published more than 400 papers in refereed conferences and journals, and has applied for or been granted more than 80 patents. He is author or editor of 20 books, including textbooks on linear algebra, machine learning, neural networks, and outlier analysis. Because of the commercial value of his patents, he has thrice been designated a Master Inventor at IBM. He has received several awards, including the EDBT Test-of-Time Award (2014), the ACM SIGKDD Innovation Award (2019), the IEEE ICDM Research Contributions Award (2015), and the IIT Kanpur Distinguished Alumnus Award (2023).He is also a recipient of the W. Wallace McDowell Award, the highest award given solely by the IEEE Computer Society across the field of computer science. He has served as an editor-in-chief of ACM Books and is currently serving as an editor-in-chief of the ACM Transactions on Knowledge Discovery from Data. He is a fellow of the SIAM, ACM, and the IEEE, for“contributions to knowledge discovery and data mining algorithms.”
Schlagwörter
Machine learning, Artificial Intelligence, Probability, Statistics, Data Mining
Thema-Inhalt
UYQM - Maschinelles Lernen
Höhe
254 mm
Breite
17.8 cm
Hersteller: Springer Nature Customer Service Center GmbH, Europaplatz 3, Heidelberg, Deutschland, 69115, ProductSafety@springernature.com
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